T 0801/00 () of 25.6.2003

European Case Law Identifier: ECLI:EP:BA:2003:T080100.20030625
Date of decision: 25 June 2003
Case number: T 0801/00
Application number: 91110658.1
IPC class: G01N 23/223
Language of proceedings: EN
Distribution: C
Download and more information:
Decision text in EN (PDF, 395 KB)
Documentation of the appeal procedure can be found in the Register
Bibliographic information is available in: EN
Versions: Unpublished
Title of application: System for analyzing metal impurity on the surface of a single crystal semiconductor by using total reflection of x-rays fluorescence
Applicant name: KABUSHIKI KAISHA TOSHIBA
Opponent name: GKSS-Forschungszentrum Geesthacht GmbH
Board: 3.4.02
Headnote: -
Relevant legal provisions:
European Patent Convention 1973 Art 56
European Patent Convention 1973 Art 114(2)
European Patent Convention 1973 R 64(b)
Keywords: Admissibilty of the appeal (yes)
Late filed documents (not admitted)
Catchwords:

-

Cited decisions:
T 0252/95
Citing decisions:
-

Source: http://www.epo.org/law-practice/case-law-appeals/recent/t000801eu1.html

Date retrieved: 17 May 2021

2 references found.

Click X to load a reference inside the current page, click on the title to open in a new page.

Case Law Book: V Priority

General Case Law